Hlutanúmer :
SN74BCT8374ADWRE4
Framleiðandi :
Texas Instruments
Lýsing :
IC SCAN TEST DEVICE W/FF 24-SOIC
Rökfræði tegund :
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Framboðsspenna :
4.5V ~ 5.5V
Vinnuhitastig :
0°C ~ 70°C
Festingargerð :
Surface Mount
Pakki / mál :
24-SOIC (0.295", 7.50mm Width)
Birgir tæki pakki :
24-SOIC