Hlutanúmer :
SN74BCT8374ANT
Framleiðandi :
Texas Instruments
Lýsing :
IC SCAN TEST DEVICE W/FF 24-DIP
Rökfræði tegund :
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Framboðsspenna :
4.5V ~ 5.5V
Vinnuhitastig :
0°C ~ 70°C
Festingargerð :
Through Hole
Pakki / mál :
24-DIP (0.300", 7.62mm)
Birgir tæki pakki :
24-PDIP