Hlutanúmer :
SN74ABT18652PM
Framleiðandi :
Texas Instruments
Lýsing :
IC SCAN-TEST-DEV/TXRX 64-LQFP
Rökfræði tegund :
Scan Test Device With Transceivers And Registers
Framboðsspenna :
4.5V ~ 5.5V
Vinnuhitastig :
-40°C ~ 85°C
Festingargerð :
Surface Mount
Birgir tæki pakki :
64-LQFP (10x10)